Silicon Wafer Contamination Characterization

Tordivel Solar has developed a revolutionary optical inspection system for Wafer Cosmetic Effects.

Read more in the press release.

The Wafer Surface Inspection System is performing an automatic surface quality control on wafers targeting the solar cell industry.

Multiple Failure Modes

Based on experience and with a standard configuration, the following failure modes are defined in the system:
  • large area contamination,
  • small area contamination
  • lines and spots
  • dark spots
  • suction cup marks
  • shiny patches.
The system works both for mono and poly-crystalline wafer.

Scorpion Vision identifies the smallest low contrast defects

Read more …

More about Tordivel Solar

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